Thin Film Analysis by X-Ray Scattering (inbunden, eng)
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter wa...
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EAN: 9783527310524
Specifikation
Böcker
- Format Inbunden
- Antal sidor 378
- Språk Engelska
- Utgivningsdatum 2005-11-15
- ISBN 9783527310524
- Förlag Wiley-VCH Verlag GmbH